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Abstract

Binomial reliability demonstration tests (BRDTs) are widely adopted demonstration tests in reliability engineering to safeguard product quality over time. Based on the testing results, a BRDT will be either accepted and the product will be released to market or a test will be rejected and the product continues into the reliability growth stage. While designing a BRDT, the actual testing results (e.g., the number of failures to be observed) are uncertain, which lead to the uncertainty associated with the acceptance/rejection decision. Conventional optimal BRDTs mainly focus on minimizing the cost at the testing phase without taking account the uncertainty of the decision and the expected cost of subsequent reliability assurance activities, typically including the reliability growth and warranty services. In this paper, a Bayesian optimal BRDT design is proposed by explicitly quantifying the test uncertainty and further integrating the BRDT testing cost with the expected reliability growth and warranty service costs. The nonlinear relationships among different BRDT design parameters, the likelihood of accepting/rejecting the test and different cost components are investigated. A comprehensive sensitivity analysis is further carried out to evaluate the expected overall cost of the proposed design under different scenarios of the cost structure. A case study is provided to illustrate the proposed method and demonstrate its advantages over the conventional BRDT designs. By incorporating the informative prior knowledge into the proposed Bayesian design, it is possible to reduce the overall cost and the sample size of a test plan.

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Notes on contributors

Suiyao Chen

Suiyao Chen is a PhD student in the Department of Industrial and Management Systems Engineering at the University of South Florida. He received his BS degree in Economics from Huazhong University of Science and Technology in 2014 and MA degree in Statistics from Columbia University in 2016. His research interests include reliability demonstration tests, Bayesian data analytics and warranty analysis. Mr. Chen is a student member of INFORMS.

Lu Lu

Lu Lu is an Assistant Professor of Statistics in the Department of Mathematics and Statistics at the University of South Florida. She was a postdoctoral research associated in the Statistics Sciences Group at Los Alamos National Laboratory. She earned a doctorate in Statistics from Iowa State University. Her research interests include reliability analysis, design of experiments, response surface methodology, survey sampling, multiple objective/response optimization. She is a member of the American Statistical Association and the American Society for Quality.

Qiong Zhang

Qiong Zhang is an Assistant Professor in statistics at Clemson University. She holds PhD degree in statistics from the University of Wisconsin-Madison. Her research interests include design and analysis for computer experiments, uncertainty quantification, and statistical methods in Engineering. She is a member of ASA and INFORMS.

Mingyang Li

Mingyang Li is an Assistant Professor in the Department of Industrial & Management Systems Engineering at the University of South Florida. He received his PhD in Systems & Industrial Engineering and MS in Statistics from the University of Arizona. He also received a MS in Mechanical & Industrial Engineering from the University of Iowa. His research interests include reliability and quality assurance, Bayesian data analytics and system informatics. Dr. Li is a member of INFORMS, IISE and ASQ.